Chip Design Contest(CDC)
Noise Immunity-Enhanced Capacitance Readout Circuit with Digital based Moving Average Filter
- 논문번호 : 202303055
- 주저자 : Dong Hyun Shin
- 소속 : Chung-Ang university
- 지도교수 : Kwanghyun Baek
- 전시담당자 : Dong Hyun Shin(agala007@naver.com)
2024
IDEC
Congress